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(parent: 914624f) | patch
tests/classifier: Make test work in big-endian systems.
authorJarno Rajahalme <jrajahalme@nicira.com>
Mon, 8 Dec 2014 18:10:07 +0000 (10:10 -0800)
committerJarno Rajahalme <jrajahalme@nicira.com>
Mon, 8 Dec 2014 18:10:07 +0000 (10:10 -0800)
commit66e1d95523a98789a5bd9ce40cd1f7b7625f6de6
tree21d3006ad68005040ac513f77a2c1b8a7a5ea4a5tree | snapshot
parent914624f81740a2502438c6b3c89478597ea78426commit | diff
tests/classifier: Make test work in big-endian systems.

Change a test so that the result will be the same in both
little-endian and big-endian systems by editing the test case so that
only one bit differs.

Reported-by: Mijo Safradin <mijo@linux.vnet.ibm.com>
Signed-off-by: Jarno Rajahalme <jrajahalme@nicira.com>
Acked-by: Ben Pfaff <blp@nicira.com>
lib/classifier.c diff | blob | history
tests/classifier.at diff | blob | history
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